Computational characterization of ordered nanostructured surfaces
Creators
- 1. Department of Chemical Engineering, University of Waterloo, Waterloo, Ontario (Canada)
Description
A vital and challenging task for materials researchers is to determine relationships between material characteristics and desired properties. While the measurement and assessment of material properties can be complex, quantitatively characterizing their structure is frequently a more challenging task. This issue is magnified for materials researchers in the areas of nanoscience and nanotechnology, where material structure is further complicated by phenomena such as self-assembly, collective behavior, and measurement uncertainty. Recent progress has been made in this area for both self-assembled and nanostructured surfaces due to increasing accessibility of imaging techniques at the nanoscale. In this context, recent advances in nanomaterial surface structure characterization are reviewed including the development of new theory and image processing methods. (topical review)
Availability note (English)
Available from http://dx.doi.org/10.1088/2053-1591/3/8/082001Additional details
Identifiers
Publishing Information
- Journal Title
- Materials Research Express (Online)
- Journal Volume
- 3
- Journal Issue
- 8
- Journal Page Range
- [12 p.]
- ISSN
- 2053-1591
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 50042690
- Subject category
- S36: MATERIALS SCIENCE; S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- IMAGE PROCESSING; NANOMATERIALS; NANOSTRUCTURES; NANOTECHNOLOGY; SURFACES
- Descriptors DEC
- MATERIALS; PROCESSING