The influence of silicon on topographical parameters and mechanical properties of the Ti-Ni-Ta-Si surface alloy synthesized on the NiTi-substrates
- 1. Institute of Strength Physics and Materials Science SB RAS, Tomsk (Russian Federation)
- 2. National Research Tomsk State University, Tomsk (Russian Federation)
- 3. Institute of High-Current Electronics SB RAS, Tomsk (Russian Federation)
Description
This work comprises a study of the effect of silicon on the topographical parameters and mechanical properties of the Ti-Ni-Ta-Si surface alloy (SA) synthesized on the NiTi-substrates by the additive thin-film electron-beam method. It was found that the roughness of [Ti-Ni-Ta-Si]SA (∼0.095 μm) has a lower value than in [Ti-Ni-Ta]SA (∼0.195 μm). The values of the yield strength σy in the surface layers of [Ti-Ni-Ta-Si]SA and [Ti-Ni-Ta]SA are characterized by a gradient decrease from ∼4.2 GPa up to ∼1.2 and ∼1.7 GPa, respectively. During the indentation, evaluation of the deformation behavior (recovered elastic –ε elast, and superelastic – εin the surface layers ofSE, residual plastic – εelast deformation) showed, that in surface layers of [Ti-Ni-Ta-Si]SA and [Ti-Ni-Ta]SA due to an increase of εelast, there was a decrease in εSE up to ∼35 and ∼22%, respectively (for the NiTi-initial εSE ≈ 38%). (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/1989/1/012003Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 1989
- Journal Issue
- 1
- Journal Page Range
- [6 p.]
- ISSN
- 1742-6596
Conference
- Title
- 18. International Conference on Prospects of Fundamental Sciences Development
- Acronym
- PFSD 2021
- Dates
- 27-30 Apr 2021
- Place
- Tomsk (Russian Federation)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53086580
- Subject category
- S36: MATERIALS SCIENCE; S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALLOYS; ELECTRON BEAMS; LAYERS; PLASTICS; SILICON; SUBSTRATES; SURFACES; THIN FILMS; YIELD STRENGTH
- Descriptors DEC
- BEAMS; ELEMENTS; FILMS; LEPTON BEAMS; MATERIALS; MECHANICAL PROPERTIES; ORGANIC COMPOUNDS; ORGANIC POLYMERS; PARTICLE BEAMS; PETROCHEMICALS; PETROLEUM PRODUCTS; POLYMERS; SEMIMETALS; SYNTHETIC MATERIALS