Published August 1, 2021 | Version v1
Journal article

The influence of silicon on topographical parameters and mechanical properties of the Ti-Ni-Ta-Si surface alloy synthesized on the NiTi-substrates

  • 1. Institute of Strength Physics and Materials Science SB RAS, Tomsk (Russian Federation)
  • 2. National Research Tomsk State University, Tomsk (Russian Federation)
  • 3. Institute of High-Current Electronics SB RAS, Tomsk (Russian Federation)

Description

This work comprises a study of the effect of silicon on the topographical parameters and mechanical properties of the Ti-Ni-Ta-Si surface alloy (SA) synthesized on the NiTi-substrates by the additive thin-film electron-beam method. It was found that the roughness of [Ti-Ni-Ta-Si]SA (∼0.095 μm) has a lower value than in [Ti-Ni-Ta]SA (∼0.195 μm). The values of the yield strength σy in the surface layers of [Ti-Ni-Ta-Si]SA and [Ti-Ni-Ta]SA are characterized by a gradient decrease from ∼4.2 GPa up to ∼1.2 and ∼1.7 GPa, respectively. During the indentation, evaluation of the deformation behavior (recovered elastic –ε elast, and superelastic – εin the surface layers ofSE, residual plastic – εelast deformation) showed, that in surface layers of [Ti-Ni-Ta-Si]SA and [Ti-Ni-Ta]SA due to an increase of εelast, there was a decrease in εSE up to ∼35 and ∼22%, respectively (for the NiTi-initial εSE ≈ 38%). (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/1989/1/012003

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
1989
Journal Issue
1
Journal Page Range
[6 p.]
ISSN
1742-6596

Conference

Title
18. International Conference on Prospects of Fundamental Sciences Development
Acronym
PFSD 2021
Dates
27-30 Apr 2021
Place
Tomsk (Russian Federation)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
53086580
Subject category
S36: MATERIALS SCIENCE; S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALLOYS; ELECTRON BEAMS; LAYERS; PLASTICS; SILICON; SUBSTRATES; SURFACES; THIN FILMS; YIELD STRENGTH
Descriptors DEC
BEAMS; ELEMENTS; FILMS; LEPTON BEAMS; MATERIALS; MECHANICAL PROPERTIES; ORGANIC COMPOUNDS; ORGANIC POLYMERS; PARTICLE BEAMS; PETROCHEMICALS; PETROLEUM PRODUCTS; POLYMERS; SEMIMETALS; SYNTHETIC MATERIALS