Published September 2009 | Version v1
Journal article

Enhanced coulomb counting method for estimating state-of-charge and state-of-health of lithium-ion batteries

  • 1. Dept. of Electrical Engineering, National Sun Yat-sen University, No. 70, Lien-hai Rd., Kaohsiung City, Taiwan (China)
  • 2. Lighting Research Laboratory, Industrial Technology Research Institute, No. 195 Chung Hsing Rd., Sec. 4 Chu Tung, Hsin Chu, Taiwan (China)
  • 3. Dept. of Electrical Engineering, National Dong Hwa University, No. 1, Sec. 2, Da-hsueh Rd., Shoufeng, Hualien, Taiwan (China)

Description

The coulomb counting method is expedient for state-of-charge (SOC) estimation of lithium-ion batteries with high charging and discharging efficiencies. The charging and discharging characteristics are investigated and reveal that the coulomb counting method is convenient and accurate for estimating the SOC of lithium-ion batteries. A smart estimation method based on coulomb counting is proposed to improve the estimation accuracy. The corrections are made by considering the charging and operating efficiencies. Furthermore, the state-of-health (SOH) is evaluated by the maximum releasable capacity. Through the experiments that emulate practical operations, the SOC estimation method is verified to demonstrate the effectiveness and accuracy.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apenergy.2008.11.021

Additional details

Identifiers

DOI
10.1016/j.apenergy.2008.11.021;
PII
S0306-2619(08)00306-1;

Publishing Information

Journal Title
Applied Energy
Journal Volume
86
Journal Issue
9
Journal Page Range
p. 1506-1511
ISSN
0306-2619
CODEN
APENDX

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44083540
Subject category
S25: ENERGY STORAGE;
Descriptors DEI
ACCURACY; CAPACITY; COULOMB CORRECTION; EFFICIENCY; ELECTRIC BATTERIES; LITHIUM IONS
Descriptors DEC
CHARGED PARTICLES; CORRECTIONS; ELECTROCHEMICAL CELLS; ENERGY STORAGE SYSTEMS; ENERGY SYSTEMS; IONS

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.