Published September 1996
| Version v1
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Tricks and tips on handling a powder diffractometers
Creators
- 1. Consiglio Nazionale delle Ricerche, Montelibretti, Rome (Italy). Istituto Chimica dei Materiali
Description
In the present work, the authors illustrate the procedure to be followed when small quantities of powder have to be analysed, and they also report how to generally reduce the measurement background. In addition, they describe how the diffractometer can be used to collect thin-film spectra. The experimental procedure requires careful handling because inappropriate or careless use of the instrument can lead to its damage
Files
28044564.pdf
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Additional details
Publishing Information
- Imprint Title
- Thin film characterisation by advanced X-ray diffraction techniques
- Imprint Pagination
- 387 p.
- Journal Page Range
- p. 357-370.
- Report number
- LNF-IR--96-049
Conference
- Title
- 5. school on X-ray diffraction from polycrystalline materials.
- Dates
- 2-5 Oct 1996.
- Place
- Frascati (Italy).
INIS
- Country of Publication
- Italy
- Country of Input or Organization
- Italy
- INIS RN
- 28044564
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALIGNMENT; MEASURING INSTRUMENTS; PERFORMANCE; POWDERS; SPECTRAL RESPONSE; THIN FILMS; X-RAY DIFFRACTOMETERS
- Descriptors DEC
- DIFFRACTOMETERS; FILMS