Published June 2005
| Version v1
Journal article
Ultraviolet photoemission and inverse-photoemission studies of Cr1-δTe
- 1. Kure College of Technology, Kure 737-8506 (Japan)
- 2. Hiroshima Synchrotron Radiation Center, Hiroshima University, Higashi-Hiroshima 739-8526 (Japan)
- 3. Graduate School of Science, Hiroshima University, Higashi-Hiroshima 739-8526 (Japan)
Description
Valence-band and conduction-band electronic structure of Cr1-δTe (0.05 ≤ δ ≤ 0.375) has been investigated by means of photoemission and inverse-photoemission spectroscopies (UPS and IPES). The Cr 3d (t2g)↑ peaks are observed at -1.2 eV relative to the Fermi level, almost independent of δ. On the other hand, Cr 3d (t2g)↓ peaks around 1.5 eV shift toward higher energy side with increasing δ. It is clearly observed that the structures due to the Te 5p states move from the UPS to IPES side near E F
Additional details
Identifiers
- DOI
- 10.1016/j.elspec.2005.01.113;
- PII
- S0368-2048(05)00116-7;
Publishing Information
- Journal Title
- Journal of Electron Spectroscopy and Related Phenomena
- Journal Volume
- 144-147
- Journal Page Range
- p. 885-887
- ISSN
- 0368-2048
- CODEN
- JESRAW
Conference
- Title
- 14. international conference on vacuum ultraviolet radiation physics
- Acronym
- VUV 14
- Dates
- 19-23 Jul 2004
- Place
- Cairns (Australia)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37039892
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHROMIUM; CHROMIUM TELLURIDES; ELECTRONIC STRUCTURE; EMISSION SPECTROSCOPY; EV RANGE; FERMI LEVEL; PHOTOEMISSION; ULTRAVIOLET RADIATION; VALENCE
- Descriptors DEC
- CHALCOGENIDES; CHROMIUM COMPOUNDS; ELECTROMAGNETIC RADIATION; ELEMENTS; EMISSION; ENERGY LEVELS; ENERGY RANGE; METALS; RADIATIONS; SECONDARY EMISSION; SPECTROSCOPY; TELLURIDES; TELLURIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.