Development of PIXE, PESA and transmission ion microscopy capability to measure aerosols by size and time
Description
We describe a new capability that consists of a combination of proton induced X-ray emission (PIXE), proton elastic scattering analysis (PESA) and transmission ion microscopy (all performed at the same location on the sample) techniques to address some of the research needs associated with time series and size-dependent composition of atmospheric aerosols. Simultaneous measurements of PIXE and PESA can be performed on aerosols collected using 3 stage improved rotating DRUM impactor by size (Stage A: 2.5-1.15 μm; Stage B: 0.34-1.15 μm; Stage C: 0.07-0.34 μm) with time resolution set by the rotation rate from 1 mm every 4 h to 1 mm every 6 min on a 16.8 cm long impaction strips that can be coated with Mylar, stretched Teflon, or aluminum, depending on the analysis method chosen. Preliminary measurements carried out using a 1 mm diameter proton beam were made on industrial test samples, yielding promising results at a time resolution of only 6 min
Additional details
Identifiers
- PII
- S0168583X01010588;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 189
- Journal Issue
- 1-4
- Journal Page Range
- p. 284-288
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 33059349
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- AEROSOLS; CASCADE IMPACTORS; ELASTIC SCATTERING; ION MICROPROBE ANALYSIS; ION SCATTERING ANALYSIS; PIXE ANALYSIS; PROTON BEAMS; TIME RESOLUTION
- Descriptors DEC
- BEAMS; CHEMICAL ANALYSIS; COLLOIDS; DISPERSIONS; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; NUCLEON BEAMS; PARTICLE BEAMS; RESOLUTION; SCATTERING; SOLS; TIMING PROPERTIES; X-RAY EMISSION ANALYSIS
Optional Information
- Copyright
- Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.