Spatial correlation in grain misorientation distribution
- 1. Department of Materials Engineering, Indian Institute of Science, Bangalore 560012 (India)
- 2. Laboratoire de Physique et Mecanique des Materiaux, Universite Paul Verlaine - Metz/CNRS, Ile du Saulcy, 57045 Metz (France)
Description
Grain misorientation was studied in relation to the nearest neighbor's mutual distance using electron back-scattered diffraction measurements. The misorientation correlation function was defined as the probability density for the occurrence of a certain misorientation between pairs of grains separated by a certain distance. Scale-invariant spatial correlation between neighbor grains was manifested by a power law dependence of the preferred misorientation vs. inter-granular distance in various materials after diverse strain paths. The obtained negative scaling exponents were in the range of -2 ± 0.3 for high-angle grain boundaries. The exponent decreased in the presence of low-angle grain boundaries or dynamic recrystallization, indicating faster decay of correlations. The correlations vanished in annealed materials. The results were interpreted in terms of lattice incompatibility and continuity conditions at the interface between neighboring grains. Grain-size effects on texture development, as well as the implications of such spatial correlations on texture modeling, were discussed.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.actamat.2009.07.035Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2009.07.035;
- PII
- S1359-6454(09)00460-1;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 57
- Journal Issue
- 18
- Journal Page Range
- p. 5382-5395
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43039014
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; BACKSCATTERING; CORRELATION FUNCTIONS; CORRELATIONS; DENSITY; DISLOCATIONS; DISTANCE; DISTRIBUTION; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; GRAIN SIZE; INTERFACES; MATERIALS; PROBABILITY; RECRYSTALLIZATION; RESIDUAL STRESSES; SCALING; SIMULATION; STRAINS
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIFFRACTION; FUNCTIONS; HEAT TREATMENTS; LINE DEFECTS; MICROSTRUCTURE; PHYSICAL PROPERTIES; SCATTERING; SIZE; STRESSES
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.