Published February 11, 1996 | Version v1
Journal article

Quasiparticle lifetimes and tunneltimes in SIS junctions for X-ray spectroscopy

  • 1. Space Res. Organ., Utrecht (Netherlands)
  • 2. Technische Univ. Twente, Enschede (Netherlands). Dept. of Applied Physics

Description

The quasiparticle lifetimes and tunneltimes in SIS tunnel junctions are essential parameters in the development of these devices for high resolution X-ray spectroscopy. We present a simple analytical model which allows us to calculate both the risetime and the total charge of the integrated tunnel current following an X-ray event. Simultaneous measurement of both the total charge and the risetime thus becomes a useful diagnostic tool for quantitative analysis. We have applied the model to recent X-ray measurements on a Nb/AlOx SIS junction. We find that the energy resolution achieved in this device is mainly limited by variations in the thickness of the counter electrode. (orig.)

Additional details

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
370
Journal Issue
1
Journal Page Range
p. 72-74.
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
6. international workshop on low temperature detectors (LTD-6).
Dates
28 Aug - 1 Sep 1995.
Place
Beatenberg, Interlaken (Switzerland).