Cryogenic in situ microcompression testing of Sn
- 1. Department of Materials Science and Engineering, University of California, Berkeley, CA (United States)
- 2. National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, CA (United States)
- 3. Jet Propulsion Laboratory, Pasadena, CA (United States)
- 4. Department of Nuclear Engineering, University of California, Berkeley, CA (United States)
Description
Characterizing plasticity mechanisms below the ductile-to-brittle transition temperature is traditionally difficult to accomplish in a systematic fashion. Here, we use a new experimental setup to perform in situ cryogenic mechanical testing of pure Sn micropillars at room temperature and at −142 °C. Subsequent electron microscopy characterization of the micropillars shows a clear difference in the deformation mechanisms at room temperature and at cryogenic temperatures. At room temperature, the Sn micropillars deformed through dislocation plasticity, while at −142 °C they exhibited both higher strength and deformation twinning. Two different orientations were tested, a symmetric (1 0 0) orientation and a non-symmetric (4 5¯ 1) orientation. The deformation mechanisms were found to be the same for both orientations
Availability note (English)
Available from http://dx.doi.org/10.1016/j.actamat.2014.06.026Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2014.06.026;
- arXiv
- arXiv:2104.00806v1;
- PII
- S1359-6454(14)00446-7;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 78
- Journal Page Range
- p. 56-64
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46117192
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BACKSCATTERING; DEFORMATION; DISLOCATIONS; DUCTILE-BRITTLE TRANSITIONS; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; PLASTICITY; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0273-0400 K; TIN; TWINNING
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIFFRACTION; ELEMENTS; LINE DEFECTS; MECHANICAL PROPERTIES; METALS; MICROSCOPY; SCATTERING; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.