Threshold and efficiency for perforation of 1 nm thick carbon nanomembranes with slow highly charged ions
Creators
- 1. Helmholtz-Zentrum Dresden-Rossendorf, Institute of Ion Beam Physics and Materials Research, 01328 Dresden (Germany)
- 2. TU Wien, Institute of Applied Physics, 1040 Vienna (Austria)
- 3. Bielefeld University, Faculty of Physics, 33615 Bielefeld (Germany)
- 4. Friedrich Schiller University Jena, Institute of Physical Chemistry, 07743 Jena (Germany)
- 5. TU Wien, USTEM, 1040 Vienna (Austria)
Description
Cross-linking of a self-assembled monolayer of 1,1′-biphenyl-4-thiol by low energy electron irradiation leads to the formation of a carbon nanomembrane, that is only 1 nm thick. Here we study the perforation of these freestanding membranes by slow highly charged ion irradiation with respect to the pore formation yield. It is found that a threshold in potential energy of the highly charged ions of about 10 keV must be exceeded in order to form round pores with tunable diameters in the range of 5–15 nm. Above this energy threshold, the efficiency for a single ion to form a pore increases from 70% to nearly 100% with increasing charge. These findings are verified by two independent methods, namely the analysis of individual membranes stacked together during irradiation and the detailed analysis of exit charge state spectra utilizing an electrostatic analyzer. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/2053-1583/2/3/035009Additional details
Identifiers
Publishing Information
- Journal Title
- 2D Materials
- Journal Volume
- 2
- Journal Issue
- 3
- Journal Page Range
- [6 p.]
- ISSN
- 2053-1583
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47113591
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- BIPHENYL; CARBON; CHARGE STATES; CROSS-LINKING; EFFICIENCY; ELECTRON BEAMS; ELECTRONS; ELECTROSTATIC ANALYZERS; IONS; IRRADIATION; MEMBRANES; NANOSTRUCTURES; PERFORATION; SPECTRA; THIOLS
- Descriptors DEC
- AROMATICS; BEAM ANALYZERS; BEAMS; CHARGED PARTICLES; CHEMICAL REACTIONS; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; HYDROCARBONS; LEPTON BEAMS; LEPTONS; NONMETALS; ORGANIC COMPOUNDS; ORGANIC SULFUR COMPOUNDS; PARTICLE BEAMS; POLYMERIZATION