Aging of imaging properties of a CMOS flat-panel detector for dental cone-beam computed tomography

We have experimentally investigated the long-term stability of imaging properties of a flat-panel detector in conditions used for dental x-ray imaging. The detector consists of a CsI:Tl layer and CMOS photodiode pixel arrays. Aging simulations were carried out using an 80-kVp x-ray beam at an air-kerma rate of approximately 5 mGy s⁻¹ at the entrance surface of the detector with a total air kerma of up to 0.6 kGy. Dark and flood-field images were periodically obtained during irradiation, and the mean signal and noise levels were evaluated for each image. We also evaluated the modulation-transfer function (MTF), noise-power spectrum (NPS), and detective quantum efficiency (DQE). The aging simulation showed a decrease in both the signal and noise of the gain-offset-corrected images, but there was negligible change in the signal-to-noise performance as a function of the accumulated dose. The gain-offset correction for analyzing images resulted in negligible changes in MTF, NPS, and DQE results over the total dose. Continuous x-ray exposure to a detector can cause degradation in the physical performance factors such the detector sensitivity, but linear analysis of the gain-offset-corrected images can assure integrity of the imaging properties of a detector during its lifetime.