Published July 2019
| Version v1
Journal article
Two-dimensional mapping of hydrogen and other elements in materials with microbeam-based transmission ERDA and PIXE
Creators
- 1. Faculty of Pure and Applied Sciences, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8571 (Japan)
- 2. Research Facility Center for Science and Technology, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8577 (Japan)
- 3. National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568 (Japan)
Description
We report on the preliminary studies for two-dimensional (2D) mapping of hydrogen and other elements in materials with transmission ERDA and PIXE using a microbeam of 8 MeV 4He. The extremely enhanced forward recoil cross section of hydrogen in the non-Rutherford scattering allows 2D mapping of hydrogen in the sample. The mapping by PIXE, which provides complementary information to the mapping by ERDA, was obtained simultaneously. The present work probably leads to 3D mapping of hydrogen in bulk materials, i.e., the present spatial 2D plus depth as an additional dimension, since the energy of the outgoing hydrogen corresponds to the depth where the hydrogen is originally located.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2018.10.015Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2018.10.015;
- PII
- S0168583X18305950;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 450
- Journal Page Range
- p. 319-322
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 23. International Conference on Ion Beam Analysis
- Acronym
- IBA 2017
- Dates
- 8-13 Oct 2017
- Place
- Shanghai (China)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54112079
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CROSS SECTIONS; PIXE ANALYSIS; RECOILS; RUTHERFORD SCATTERING; TWO-DIMENSIONAL SYSTEMS
- Descriptors DEC
- CHEMICAL ANALYSIS; CRYSTAL LATTICES; CRYSTAL STRUCTURE; ELASTIC SCATTERING; NONDESTRUCTIVE ANALYSIS; SCATTERING; X-RAY EMISSION ANALYSIS
Optional Information
- Copyright
- Copyright (c) 2018 Elsevier B.V. All rights reserved.