Published July 2019 | Version v1
Journal article

Two-dimensional mapping of hydrogen and other elements in materials with microbeam-based transmission ERDA and PIXE

  • 1. Faculty of Pure and Applied Sciences, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8571 (Japan)
  • 2. Research Facility Center for Science and Technology, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8577 (Japan)
  • 3. National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568 (Japan)

Description

We report on the preliminary studies for two-dimensional (2D) mapping of hydrogen and other elements in materials with transmission ERDA and PIXE using a microbeam of 8 MeV 4He. The extremely enhanced forward recoil cross section of hydrogen in the non-Rutherford scattering allows 2D mapping of hydrogen in the sample. The mapping by PIXE, which provides complementary information to the mapping by ERDA, was obtained simultaneously. The present work probably leads to 3D mapping of hydrogen in bulk materials, i.e., the present spatial 2D plus depth as an additional dimension, since the energy of the outgoing hydrogen corresponds to the depth where the hydrogen is originally located.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2018.10.015

Additional details

Identifiers

DOI
10.1016/j.nimb.2018.10.015;
PII
S0168583X18305950;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
450
Journal Page Range
p. 319-322
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
23. International Conference on Ion Beam Analysis
Acronym
IBA 2017
Dates
8-13 Oct 2017
Place
Shanghai (China)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
54112079
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CROSS SECTIONS; PIXE ANALYSIS; RECOILS; RUTHERFORD SCATTERING; TWO-DIMENSIONAL SYSTEMS
Descriptors DEC
CHEMICAL ANALYSIS; CRYSTAL LATTICES; CRYSTAL STRUCTURE; ELASTIC SCATTERING; NONDESTRUCTIVE ANALYSIS; SCATTERING; X-RAY EMISSION ANALYSIS

Optional Information

Copyright
Copyright (c) 2018 Elsevier B.V. All rights reserved.