Published June 5, 2006 | Version v1
Journal article

Diminished Shockley-Read-Hall recombination in near-surface pseudomorphic Si1-xGe x/Si double quantum wells

  • 1. PRESTO, Japan Science and Technology Agency (JST), Kawaguchi, Saitama 332-0012 (Japan) and Graduate School of Arts and Sciences, University of Tokyo, 3-8-1 Komaba, Meguro, Tokyo 153-8902 (Japan)
  • 2. Graduate School of Arts and Sciences, University of Tokyo, 3-8-1 Komaba, Meguro, Tokyo 153-8902 (Japan)
  • 3. PRESTO, Japan Science and Technology Agency (JST), Kawaguchi, Saitama 332-0012 (Japan)

Description

The unique type-II potential lineup of pseudomorphic Si1-xGe x/Si quantum wells (QWs) allows a negative charge buildup in the near-surface region. As a result, diminished Shockley-Read-Hall (SRH) recombination is observed in the surface-side QW in a double QW geometry where charge imbalance due to the negative charge buildup plays a critical role. Spectral changes due to the charge redistribution under longitudinal electric fields indicate that the second QW on the substrate-side is key to the charge imbalance, and allows an enhanced internal quantum efficiency of radiative recombination in the surface-side QW

Additional details

Identifiers

DOI
10.1016/j.tsf.2005.09.199;
PII
S0040-6090(05)02019-5;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
508
Journal Issue
1-2
Journal Page Range
p. 414-417
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
4. international conference on silicon epitaxy and heterostructures
Acronym
ICSI-4
Dates
23-26 May 2005
Place
Awaji Island, Hyogo (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38004743
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ELECTRIC FIELDS; GERMANIUM SILICIDES; QUANTUM EFFICIENCY; QUANTUM WELLS; RECOMBINATION; SURFACES
Descriptors DEC
EFFICIENCY; GERMANIUM COMPOUNDS; NANOSTRUCTURES; SILICIDES; SILICON COMPOUNDS

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.