Published July 2008
| Version v1
Journal article
Transient radiation experiments for 8-bit PDSOI MCU
Creators
- 1. Chinese Academy of Sciences, Beijing (China). Inst. of Microelectronics
- 2. Northwest Inst. of Nuclear Technology, Xi'an (China)
Description
Two experiments have been designed for the 8-bit PDSOI MCU J80C51RH developed by Institute of Microelectronics of Chinese Academy of Sciences. Hardware and software for the experiments are also designed. The experiments have been performed in the Northwest Institute of Nuclear Technology with the equipment Qiangguang-I accelerator. Data of the experiments are successfully accessed and prove that the MCU J80C51RH can work perfectly in the γ ray radiation environment with dose rate up to 1E11 rad(Si)/s. The hardware and software can work well in the experiments. (authors)
Additional details
Publishing Information
- Journal Title
- Nuclear Electronics and Detection Technology
- Journal Volume
- 28
- Journal Issue
- 4
- Journal Page Range
- p. 813-816
- ISSN
- 0258-0934
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 41064650
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ACCELERATORS; DATA ANALYSIS; DOSE RATES; INTEGRATED CIRCUITS; IRRADIATION; NUCLEAR EXPLOSIONS; PHYSICAL RADIATION EFFECTS; PROGRAMMING; PROMPT GAMMA RADIATION; TRANSIENTS
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; ELECTRONIC CIRCUITS; EXPLOSIONS; GAMMA RADIATION; IONIZING RADIATIONS; MICROELECTRONIC CIRCUITS; RADIATION EFFECTS; RADIATIONS
Optional Information
- Notes
- 6 figs., 1 tab., 2 refs.