Electron-impact excitation of multicharged ions: Merged beams experiments
- 1. Physics Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6372 (United States)
- 2. Department of Physics, Chungnam National University, Gung-Dong 220, 3005-764 Daejon, South (Korea, Republic of)
- 3. JILA, University of Colorado and National Institute of Standards and Technology, Boulder, Colorado 80309-0440 (United States)
- 4. Department of Physics and Astronomy, University College London, London WC1E 6BT (United Kingdom)
- 5. Department of Physics, St. Francis Xavier University, Antigonish, Nova Scotia, Canada, B2G 2W5 (Canada)
Description
Electron-impact excitation cross sections for several multicharged ions have been measured near threshold using the merged electron-ion beams energy loss (MEIBEL) technique. This technique allows the investigation of optically-allowed and forbidden transitions with sufficient energy resolution, typically about 0.2 eV, to resolve resonance structures in the cross sections. Results from the JILA/ORNL MEIBEL experiment on allowed transitions in several multicharged ions demonstrate the ability of various theoretical methods to predict cross sections in the absence of resonances. Comparisons of R-matrix calculations and measured cross sections for transitions in Mg-like Si2+ and Ar6+, however, indicate that theory must continue to evolve in order to more accurately predict cross sections involving significant contributions from dielectronic resonances and interactions between neighboring resonances. copyright 1999 American Institute of Physics
Additional details
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 475
- Journal Issue
- 1
- Journal Page Range
- p. 126-129
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 15. international conference on the application of accelerators in research and industry
- Dates
- 4-7 Nov 1998
- Place
- Denton, TX (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 31002258
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ARGON; CROSS SECTIONS; ELECTRON SPECTRA; ELECTRON-ION COLLISIONS; ENERGY-LEVEL TRANSITIONS; IONS; R MATRIX; SILICON
- Descriptors DEC
- CHARGED PARTICLES; COLLISIONS; ELECTRON COLLISIONS; ELEMENTS; FLUIDS; GASES; ION COLLISIONS; MATRICES; NONMETALS; RARE GASES; SEMIMETALS; SPECTRA
Optional Information
- Secondary number(s)
- CONF-981122--