Published 1988 | Version v1
Book Metadata-only

Peculiar processes in glass surface analysis

Creators

  • 1. Istituto Nazionale di Fisica Nucleare, Legnaro (Italy)
  • 2. Padua Univ. (Italy). Ist. di Fisica

Description

Modern techniques for surface analysis use charged particles as probes. Many problems arise when insulating materials are studied. Surface modifications induced by electron-, proton-, and heavy ion-irradiations are discussed, including theoretical models. 23 refs.; 20 figs

Additional details

Publishing Information

Publisher
Kluwer Academic.
Imprint Place
Dordrecht (Netherlands)
ISBN
90-247-3703-6
Imprint Title
Nuclear physics applications on materials science
Imprint Pagination
468 p.
Journal Volume
144
Series
NATO ASI Series E.;Applied Sciences.
Journal Page Range
p. 313-326.

Conference

Title
NATO Advanced Science Institute on nuclear physics applications on materials science.
Dates
6-18 Sep 1987.
Place
Viana do Castelo (Portugal).

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
19096914
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference, Numerical Data
Descriptors DEI
ARGON IONS; AUGER ELECTRON SPECTROSCOPY; BACKSCATTERING; CATIONS; COMPILED DATA; ELECTRIC FIELDS; ELECTRON BEAMS; GLASS; ION SCATTERING ANALYSIS; IRRADIATION; KEV RANGE 10-100; KEV RANGE 100-1000; LEAD IONS; NUCLEAR REACTION ANALYSIS; PROTON BEAMS; QUANTITATIVE CHEMICAL ANALYSIS; RADIATION DOSES; RADIATION EFFECTS; RUBIDIUM IONS; RUTHERFORD SCATTERING; SURFACES
Descriptors DEC
ATOMIC IONS; BEAMS; CHARGED PARTICLES; CHEMICAL ANALYSIS; DATA; ELASTIC SCATTERING; ELECTRON SPECTROSCOPY; ENERGY RANGE; INFORMATION; IONS; KEV RANGE; LEPTON BEAMS; NONDESTRUCTIVE ANALYSIS; NUCLEON BEAMS; NUMERICAL DATA; PARTICLE BEAMS; SCATTERING; SPECTROSCOPY

Optional Information

Notes
Imprint:Includes index.