Published June 2019 | Version v1
Miscellaneous Open

Towards high spatial resolution studies of magnetism with transmission electron microscopes

Creators

  • 1. Department of Physics and Astronomy, 75120, Uppsala (Sweden)

Description

Electron magnetic circular dichroism (EMCD) has been proposed in 2003 and for the first time experimentally realized in 2006. Since then the method went through a rapid development at both fronts - experimental and theoretical. Dynamical diffraction effects severely complicate EMCD detection and often reduce the its strength. To circumvent this, numerous ways of acquiring EMCD have been proposed and many of them were experimentally tested. Recently, EMCD was detected using astigmatic electron beams on antiferromagnets, or with convergent probes, resolving magnetic signals from areas smaller than a square nanometer. In high-resolution TEM setting, EMCD signal from individual atomic planes was detected using the PICO instrument, where a crucial role was played by chromatic aberration corrector. Theory predicts that electron vortex beams should be efficient probes of EMCD at atomic resolution [6]. Successful realization of this experiment could be extended further to probe the third dimension by means of magnetic depth sectioning. We will review the recent history of EMCD, its present state-of-the-art and discuss some of its challenges for the near future. (authors)

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Part of:
25. International Conference on Applied Physics of Condensed Matter. Book of Abstracts

Additional details

Publishing Information

Publisher
Slovak University of Technology
Imprint Place
Bratislava (Slovakia)
Imprint Title
25. International Conference on Applied Physics of Condensed Matter. Book of Abstracts
Imprint Pagination
50 p.
Journal Page Range
1 p.
Report number
INIS-SK--2023-045

Conference

Title
APCOM 2019. Book of Abstracts
Dates
19-21 Jun 2019
Place
Strbske Pleso (Slovakia)

INIS

Country of Publication
Slovakia
Country of Input or Organization
Slovakia
INIS RN
54115912
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ELECTRON BEAMS; MATERIALS TESTING; SOLID STATE PHYSICS; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
BEAMS; ELECTRON MICROSCOPY; LEPTON BEAMS; MICROSCOPY; PARTICLE BEAMS; PHYSICS; TESTING

Optional Information

Notes
7 refs. Imprint:Published only on the web 11.0 MBytes in PDF format; All full-text contributions in Conference Proceedings published through American Institute of Physics were reviewed by two members of the International Program Committee