Published July 1976
| Version v1
Journal article
Some applications of the high voltage electron microscope in physical metallurgy
Creators
- 1. CEA Centre d'Etudes Nucleaires de Saclay, 91 - Gif-sur-Yvette (France). Section de Recherches de Metallurgie Physique
Description
The high voltage electron microscope (HVEM) is a microscope with a much higher penetration than the usual ones, as well as being a remarkable irradiation machine. The possible applications of the HVEM related to its advantages over the conventional microscopes are first discussed. The simultaneous use of the HVEM as an irradiation machine and an observation tool is then discussed, experiments carried in the laboratory being referred to. The last use of the HVEM makes it an irreplaceable tool for continuously following the clustering of irradiation defects
Abstract (French)
Le microscope electronique a haute tension (MEHT) est a la fois un microsope, plus performant a maints egards que ceux fonctionnant sous des tensions plus basses, et une excellente machine a irradier. On dresse d'abord brievement un panorama des applications possibles du MEHT liees aux avantages qu'il presente sur les microscopes conventionnels. Puis, en s'appuyant sur les experiences effectuees au laboratoire, on presente avec plus de details, les possibilites d'emploi simultane du MEHT, comme machine a irradier et instrument d'observation. Cette ambivalence fait de l'appareil un outil irremplacable pour l'etude des defauts d'irradiation, en vue de la comprehension des mecanismes qui gouvernent leur evolutionAdditional details
Additional titles
- Original title (French)
- Quelques applications de la microscopie electronique a haute tension en metallurgie physique
Publishing Information
- Journal Title
- Bull. Inf. Sci. Tech. (Paris)
- Journal Issue
- no.216
- Series
- Bull. Inf. Sci. Tech. (Paris).
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 8281085
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ELECTRON BEAMS; ELECTRON MICROSCOPY; METALS; PHYSICAL RADIATION EFFECTS
- Descriptors DEC
- BEAMS; ELEMENTS; LEPTON BEAMS; MICROSCOPY; PARTICLE BEAMS; RADIATION EFFECTS