Published December 19, 2003
| Version v1
Journal article
Auger-Photoelectron Coincidence Spectroscopy (APECS): Reviewing a Growing Field
Creators
- 1. NanoPhysics Laboratory, Rutgers University, 136 Frelinghuysen Rd, Piscataway, NJ 08854 (United States)
- 2. Department of Physics, Laboratory for Surface Modification, Rutgers University, 136 Frelinghuysen Rd, Piscataway, NJ 08854 (United States)
Description
Electron-electron coincidence techniques have been widely used to study atoms and molecules. In contrast, the application of APECS to solids has been much more limited. Recently, however, APECS has started to progress from a technique that is primarily devoted to analyzing Auger line shapes and making interesting anecdotal observations, to an important tool that compliments other analytic techniques for the characterization of solids and their surfaces. In this contribution I will briefly review the status of the field and offer some suggestions for possible scientific opportunities and technological advances
Additional details
Identifiers
- DOI
- 10.1063/1.1643686;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 697
- Journal Issue
- 1
- Journal Page Range
- p. 111-118
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- International symposium on (e,2e), double photoionization and related topics; 12. International symposium on polarization and correlation in electronic and atomic collisions
- Dates
- 30 Jul - 2 Aug 2003
- Place
- Konigstein (Germany)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36070707
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMS; AUGER ELECTRON SPECTROSCOPY; COINCIDENCE SPECTROMETRY; ELECTRONS; HOLES; MOLECULES; PHOTOELECTRON SPECTROSCOPY; RECOMBINATION; REVIEWS; SOLIDS; SURFACES; TIME-OF-FLIGHT METHOD; TRANSITION ELEMENT COMPOUNDS
- Descriptors DEC
- COINCIDENCE METHODS; COUNTING TECHNIQUES; DOCUMENT TYPES; ELECTRON SPECTROSCOPY; ELEMENTARY PARTICLES; FERMIONS; LEPTONS; SPECTROSCOPY
Optional Information
- Notes
- (c) 2003 American Institute of Physics