Published September 3, 2010
| Version v1
Journal article
Two-particle Aharonov-Bohm effect in electronic interferometers
- 1. Institut fuer Theoretische Physik A, RWTH Aachen University, D-52056 Aachen (Germany)
- 2. Division of Mathematical Physics, Lund University, Box 118, S-221 00 Lund (Sweden)
- 3. Department of Metal and Semiconductor Physics, NTU 'Kharkiv Polytechnic Institute', 61002 Kharkiv (Ukraine)
- 4. Departement de Physique Theorique, Universite de Geneve, CH-1211 Geneve 4 (Switzerland)
Description
We review recent theoretical investigations on the two-particle Aharonov-Bohm effect and its relation to entanglement production and detection. The difficulties of the entanglement detection due to dephasing and finite temperature are discussed regarding a recent experimental realization of a two-particle Aharonov-Bohm interferometer [15]. We also discuss a theoretical proposal for a two-particle Aharonov-Bohm interferometer, which as against the finite bias setup is driven with dynamical single-electron sources allowing for the tunable production of time-bin entanglement.
Availability note (English)
Available from http://dx.doi.org/10.1088/1751-8113/43/35/354027Additional details
Identifiers
- DOI
- 10.1088/1751-8113/43/35/354027;
- PII
- S1751-8113(10)48885-X;
Publishing Information
- Journal Title
- Journal of Physics. A, Mathematical and Theoretical (Online)
- Journal Volume
- 43
- Journal Issue
- 35
- Journal Page Range
- [9 p.]
- ISSN
- 1751-8121
Conference
- Title
- Conference on 50 years of the Aharonov-Bohm Effect; Conference on Aharonov-Bohm Effect and Berry Phase 50/25 anniversary
- Dates
- 11-14 Oct 2009; 14-15 Dec 2009
- Place
- Tel Aviv (Israel); Bristol (United Kingdom)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42036962
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AHARONOV-BOHM EFFECT; ELECTRON SOURCES; INTERFEROMETERS; QUANTUM ENTANGLEMENT; QUANTUM MECHANICS
- Descriptors DEC
- MEASURING INSTRUMENTS; MECHANICS; PARTICLE SOURCES; RADIATION SOURCES