Published July 2012 | Version v1
Journal article Metadata-only

Irradiation induced changes in small angle grain boundaries in mosaic Cu thin films

Creators

  • 1. Los Alamos National Laboratory, Center for Integrated Nanotechnologies, Materials Physics and Application Division, Los Alamos, NM (United States)
  • 2. Los Alamos National Laboratory, Materials Science and Technology Division, Los Alamos, NM (United States)
  • 3. Texas A and M University, Department of Nuclear Engineering, College Station, TX (United States)

Description

We studied the effect of irradiation on small angle grain boundaries in mosaic structured Cu thin films. The films showed a decrease in mosaic spread via a narrowing of the full width at half maximum in XRD rocking curves and a smaller minimum yield of RBS channeling after irradiation. These data indicate the irradiation decreased the misorientation angles between mosaic blocks separated by small angle grain boundaries. Mechanisms involving interactions between grain boundary dislocations and irradiation induced defects are discussed. (orig.)

Availability note (English)

Available from: http://dx.doi.org/10.1007/s00339-012-6865-y

Additional details

Identifiers

DOI
10.1007/s00339-012-6865-y;

Publishing Information

Journal Title
Applied Physics. A, Materials Science and Processing
Journal Volume
108
Journal Issue
1
Journal Page Range
p. 121-126
ISSN
0947-8396
CODEN
APAMFC

INIS

Country of Publication
Germany
Country of Input or Organization
Germany
INIS RN
43092095
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
COPPER; DISLOCATIONS; GRAIN BOUNDARIES; GRAIN ORIENTATION; HELIUM IONS; INTERSTITIALS; ION CHANNELING; ION COLLISIONS; KEV RANGE 100-1000; MEV RANGE 01-10; MONOCRYSTALS; PHYSICAL RADIATION EFFECTS; SILICON; SUBSTRATES; SURFACES; THIN FILMS; X-RAY DIFFRACTION
Descriptors DEC
CHANNELING; CHARGED PARTICLES; COHERENT SCATTERING; COLLISIONS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALS; DIFFRACTION; ELEMENTS; ENERGY RANGE; FILMS; IONS; KEV RANGE; LINE DEFECTS; METALS; MEV RANGE; MICROSTRUCTURE; ORIENTATION; POINT DEFECTS; RADIATION EFFECTS; SCATTERING; SEMIMETALS; TRANSITION ELEMENTS