Published May 12, 2004 | Version v1
Journal article Metadata-only

Multi-element Analyzer for Inelastic X-Ray Scattering

Creators

  • 1. NSLS, Brookhaven National Laboratory, Upton, NY, 11973 (United States)
  • 2. Department of Physics, New Jersey Institute of Technology, Newark, NJ 07102 (United States)
  • 3. Advanced Design Consulting, Lansing, NY 14882 (United States)

Description

A nine-element analyzer-system for inelastic x-ray scattering has been designed and built. Each individual analyzer crystal is aligned with an inverse joy-stick goniometer. The energy of the scattered photons is measured with a conventional double-circle goniometer mounted on a translation stage, which allows the maintenance of the sample, analyzers and detector, also mounted on a separate translation stage, on a Rowland-circle

Additional details

Identifiers

DOI
10.1063/1.1757939;

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
705
Journal Issue
1
Journal Page Range
p. 893-896
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
8. international conference on synchrotron radiation instrumentation
Dates
25-29 Aug 2003
Place
San Francisco, CA (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36092682
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION SPECTROSCOPY; CRYSTALS; GONIOMETERS; INELASTIC SCATTERING; MAINTENANCE; PHOTON BEAMS; SPECTROMETERS; SYNCHROTRON RADIATION; X-RAY DETECTION; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY
Descriptors DEC
BEAMS; BREMSSTRAHLUNG; COHERENT SCATTERING; DETECTION; DIFFRACTION; ELECTROMAGNETIC RADIATION; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATIONS; SCATTERING; SPECTROSCOPY

Optional Information

Notes
(c) 2004 American Institute of Physics