Published July 16, 2007 | Version v1
Journal article

Colour sensitive devices based on double p-i-n-i-p stacked photodiodes

  • 1. Electronics Telecommunications and Computer Department, ISEL, Lisbon (Portugal)
  • 2. Department of Electrical and Computer Engineering, University Waterloo, Waterloo, Ontario, N2L3G1 (Canada)

Description

In this work, we report on an amorphous silicon based image sensor with a bias voltage controllable spectral response characteristics. This multilayered device is composed by two stacked p-i-n-i-p structures produced by plasma enhanced chemical vapour deposition on a glass substrate and sandwiched between two transparent conductive oxide electrodes with a patterned molybdenum layer between the sensing and switching structures. Optical readout technique is used for image readout. Device performances have been evaluated from the current-voltage characteristics and spectral response measurements performed for the p-i-n-i-p test structures and stacked device. It is demonstrated that the device is sensitive to blue-green or red light depending on polarity of the bias voltage enabling the detection of colour images. Device design is discussed and supported by a numerical simulation

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2006.11.132

Additional details

Identifiers

DOI
10.1016/j.tsf.2006.11.132;
PII
S0040-6090(06)01439-8;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
515
Journal Issue
19
Journal Page Range
p. 7526-7529
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
Symposium I on thin films for large area electronics EMRS 2007 conference
Acronym
EMRS 2006 - Symposium J
Dates
29 May - 2 Jun 2006
Place
Nice (France)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39069087
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CHEMICAL VAPOR DEPOSITION; COLOR; ELECTRONIC EQUIPMENT; MOLYBDENUM; OXIDES; PHOTODIODES; SEMICONDUCTOR MATERIALS; SILICON; SIMULATION
Descriptors DEC
CHALCOGENIDES; CHEMICAL COATING; DEPOSITION; ELEMENTS; EQUIPMENT; MATERIALS; METALS; OPTICAL PROPERTIES; ORGANOLEPTIC PROPERTIES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; REFRACTORY METALS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SEMIMETALS; SURFACE COATING; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.