Colour sensitive devices based on double p-i-n-i-p stacked photodiodes
- 1. Electronics Telecommunications and Computer Department, ISEL, Lisbon (Portugal)
- 2. Department of Electrical and Computer Engineering, University Waterloo, Waterloo, Ontario, N2L3G1 (Canada)
Description
In this work, we report on an amorphous silicon based image sensor with a bias voltage controllable spectral response characteristics. This multilayered device is composed by two stacked p-i-n-i-p structures produced by plasma enhanced chemical vapour deposition on a glass substrate and sandwiched between two transparent conductive oxide electrodes with a patterned molybdenum layer between the sensing and switching structures. Optical readout technique is used for image readout. Device performances have been evaluated from the current-voltage characteristics and spectral response measurements performed for the p-i-n-i-p test structures and stacked device. It is demonstrated that the device is sensitive to blue-green or red light depending on polarity of the bias voltage enabling the detection of colour images. Device design is discussed and supported by a numerical simulation
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2006.11.132Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2006.11.132;
- PII
- S0040-6090(06)01439-8;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 515
- Journal Issue
- 19
- Journal Page Range
- p. 7526-7529
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- Symposium I on thin films for large area electronics EMRS 2007 conference
- Acronym
- EMRS 2006 - Symposium J
- Dates
- 29 May - 2 Jun 2006
- Place
- Nice (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39069087
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHEMICAL VAPOR DEPOSITION; COLOR; ELECTRONIC EQUIPMENT; MOLYBDENUM; OXIDES; PHOTODIODES; SEMICONDUCTOR MATERIALS; SILICON; SIMULATION
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL COATING; DEPOSITION; ELEMENTS; EQUIPMENT; MATERIALS; METALS; OPTICAL PROPERTIES; ORGANOLEPTIC PROPERTIES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; REFRACTORY METALS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SEMIMETALS; SURFACE COATING; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.