Published September 11, 1998 | Version v1
Journal article Metadata-only

Calculation of the average path of gamma-rays in the crystal of semiconductor gamma-ray spectrometers using the total efficiency calibration curve

Creators

Description

A method for calculating the average path traversed in the detector crystal by the detected gamma-rays using the total efficiency calibration curves for point sources placed close to the detector was developed. The influence of the crystal volume, shape and dead layer on the average path is discussed. A method for extrapolation of the total efficiency calibration curves to energies up to 5 MeV is presented

Additional details

Identifiers

PII
S0969804397100513;

Publishing Information

Journal Title
Applied Radiation and Isotopes
Journal Volume
49
Journal Issue
9-11
Journal Page Range
p. 1231-1234
ISSN
0969-8043
CODEN
ARISEF

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
34013566
Subject category
S07: ISOTOPES AND RADIATION SOURCES;
Descriptors DEI
CALIBRATION; CRYSTAL STRUCTURE; DIAGRAMS; EFFICIENCY; GAMMA SPECTROMETERS; SEMICONDUCTOR DETECTORS; SHAPE
Descriptors DEC
INFORMATION; MEASURING INSTRUMENTS; RADIATION DETECTORS; SPECTROMETERS

Optional Information

Copyright
Copyright (c) 1998 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.