Computer programs for unit-cell determination in electron diffraction experiments
Creators
- 1. Center for Materials Research and Analysis, University of Nebraska, WSCE N 104, Lincoln 685880656 NE (United States)
Description
A set of computer programs for unit-cell determination from an electron diffraction tilt series and pattern indexing has been developed on the basis of several well-established algorithms. In this approach, a reduced direct primitive cell is first determined from experimental data, in the means time, the measurement errors of the tilt angles are checked and minimized. The derived primitive cell is then checked for possible higher lattice symmetry and transformed into a proper conventional cell. Finally a least-squares refinement procedure is adopted to generate optimum lattice parameters on the basis of the lengths of basic reflections in each diffraction pattern and the indices of these reflections. Examples are given to show the usage of the programs
Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2004.10.008;
- PII
- S0304-3991(04)00192-5;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 102
- Journal Issue
- 4
- Journal Page Range
- p. 269-277
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37036571
- Subject category
- S99: GENERAL AND MISCELLANEOUS;
- Descriptors DEI
- ALGORITHMS; COMPUTER CODES; ELECTRON DIFFRACTION; ERRORS; LATTICE PARAMETERS; LEAST SQUARE FIT; SYMMETRY
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; MATHEMATICAL LOGIC; MATHEMATICAL SOLUTIONS; MAXIMUM-LIKELIHOOD FIT; NUMERICAL SOLUTION; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.