Published March 2005 | Version v1
Journal article

Computer programs for unit-cell determination in electron diffraction experiments

Creators

  • 1. Center for Materials Research and Analysis, University of Nebraska, WSCE N 104, Lincoln 685880656 NE (United States)

Description

A set of computer programs for unit-cell determination from an electron diffraction tilt series and pattern indexing has been developed on the basis of several well-established algorithms. In this approach, a reduced direct primitive cell is first determined from experimental data, in the means time, the measurement errors of the tilt angles are checked and minimized. The derived primitive cell is then checked for possible higher lattice symmetry and transformed into a proper conventional cell. Finally a least-squares refinement procedure is adopted to generate optimum lattice parameters on the basis of the lengths of basic reflections in each diffraction pattern and the indices of these reflections. Examples are given to show the usage of the programs

Additional details

Identifiers

DOI
10.1016/j.ultramic.2004.10.008;
PII
S0304-3991(04)00192-5;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
102
Journal Issue
4
Journal Page Range
p. 269-277
ISSN
0304-3991
CODEN
ULTRD6

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37036571
Subject category
S99: GENERAL AND MISCELLANEOUS;
Descriptors DEI
ALGORITHMS; COMPUTER CODES; ELECTRON DIFFRACTION; ERRORS; LATTICE PARAMETERS; LEAST SQUARE FIT; SYMMETRY
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; MATHEMATICAL LOGIC; MATHEMATICAL SOLUTIONS; MAXIMUM-LIKELIHOOD FIT; NUMERICAL SOLUTION; SCATTERING

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.