Simulation of visible and ultra-violet group-III nitride light emitting diodes

One-dimensional drift-diffusion model accounting for the unique properties of group-III nitrides is employed to simulate the carrier transport and radiative/non-radiative recombination of electrons and holes in light emitting diode heterostructures. Mixed finite-element method is used for numerical implementation of the model. The emission spectra are computed via the self-consistent solution of the Schroedinger-Poisson equations with account of complex valence band structure of nitride materials. Simulations of a number of single- and multiple-quantum well blue and ultraviolet light emitting diodes are presented and compared with available observations. Specific features of the III-nitride Led operation are considered in terms of modelling. Applicability of the drift-diffusion model to analysis of III-nitride LEDs is proved and still open questions are discussed