Band gap effects of hexagonal boron nitride using oxygen plasma
Creators
- 1. School of Electrical and Electronic Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798 (Singapore)
- 2. Temasek Laboratories-NTU, 50 Nanyang Avenue, Singapore 639798 (Singapore)
- 3. Weapons and Materials Research Directorate, U.S. Army Research Laboratory, Aberdeen Proving Ground, Maryland 21005 (United States)
- 4. School of Materials Science and Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798 (Singapore)
Description
Tuning of band gap of hexagonal boron nitride (h-BN) has been a challenging problem due to its inherent chemical stability and inertness. In this work, we report the changes in band gaps in a few layers of chemical vapor deposition processed as-grown h-BN using a simple oxygen plasma treatment. Optical absorption spectra show a trend of band gap narrowing monotonically from 6 eV of pristine h-BN to 4.31 eV when exposed to oxygen plasma for 12 s. The narrowing of band gap causes the reduction in electrical resistance by ∼100 fold. The x-ray photoelectron spectroscopy results of plasma treated hexagonal boron nitride surface show the predominant doping of oxygen for the nitrogen vacancy. Energy sub-band formations inside the band gap of h-BN, due to the incorporation of oxygen dopants, cause a red shift in absorption edge corresponding to the band gap narrowing
Additional details
Identifiers
- DOI
- 10.1063/1.4872318;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 104
- Journal Issue
- 16
- Journal Page Range
- p. 163101-163101.4
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45083806
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BORON NITRIDES; CHEMICAL VAPOR DEPOSITION; DOPED MATERIALS; LAYERS; OXYGEN; VACANCIES; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- BORON COMPOUNDS; CHEMICAL COATING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DEPOSITION; ELECTRON SPECTROSCOPY; ELEMENTS; MATERIALS; NITRIDES; NITROGEN COMPOUNDS; NONMETALS; PHOTOELECTRON SPECTROSCOPY; PNICTIDES; POINT DEFECTS; SPECTROSCOPY; SURFACE COATING
Optional Information
- Notes
- (c) 2014 AIP Publishing LLC