Published February 10, 2014 | Version v1
Journal article

Epitaxial growth of VO2 by periodic annealing

  • 1. Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853-1501 (United States)
  • 2. Neutron Science Division, Korea Atomic Energy Research Institute, Daejeon 305-353 (Korea, Republic of)
  • 3. Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801 (United States)
  • 4. Department of Physics, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801 (United States)
  • 5. Department of Physics and Materials Research Institute, Pennsylvania State University, University Park, Pennsylvania 16802 (United States)
  • 6. School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853 (United States)
  • 7. Peter Grünberg Institute, PGI 9-IT, JARA-FIT, Research Centre Jülich, D-52425 Jülich (Germany)
  • 8. Kavli Institute at Cornell for Nanoscale Science, Ithaca, New York 14853 (United States)

Description

We report the growth of ultrathin VO2 films on rutile TiO2 (001) substrates via reactive molecular-beam epitaxy. The films were formed by the cyclical deposition of amorphous vanadium and its subsequent oxidation and transformation to VO2 via solid-phase epitaxy. Significant metal-insulator transitions were observed in films as thin as 2.3 nm, where a resistance change ΔR/R of 25 was measured. Low angle annular dark field scanning transmission electron microscopy was used in conjunction with electron energy loss spectroscopy to study the film/substrate interface and revealed the vanadium to be tetravalent and the titanium interdiffusion to be limited to 1.6 nm

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
104
Journal Issue
6
Journal Page Range
p. 063104-063104.5
ISSN
0003-6951
CODEN
APPLAB

Optional Information

Notes
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