Published February 10, 2014
| Version v1
Journal article
Epitaxial growth of VO2 by periodic annealing
Creators
- 1. Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853-1501 (United States)
- 2. Neutron Science Division, Korea Atomic Energy Research Institute, Daejeon 305-353 (Korea, Republic of)
- 3. Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801 (United States)
- 4. Department of Physics, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801 (United States)
- 5. Department of Physics and Materials Research Institute, Pennsylvania State University, University Park, Pennsylvania 16802 (United States)
- 6. School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853 (United States)
- 7. Peter Grünberg Institute, PGI 9-IT, JARA-FIT, Research Centre Jülich, D-52425 Jülich (Germany)
- 8. Kavli Institute at Cornell for Nanoscale Science, Ithaca, New York 14853 (United States)
Description
We report the growth of ultrathin VO2 films on rutile TiO2 (001) substrates via reactive molecular-beam epitaxy. The films were formed by the cyclical deposition of amorphous vanadium and its subsequent oxidation and transformation to VO2 via solid-phase epitaxy. Significant metal-insulator transitions were observed in films as thin as 2.3 nm, where a resistance change ΔR/R of 25 was measured. Low angle annular dark field scanning transmission electron microscopy was used in conjunction with electron energy loss spectroscopy to study the film/substrate interface and revealed the vanadium to be tetravalent and the titanium interdiffusion to be limited to 1.6 nm
Additional details
Identifiers
- DOI
- 10.1063/1.4864404;
- arXiv
- arXiv:1310.5021v4;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 104
- Journal Issue
- 6
- Journal Page Range
- p. 063104-063104.5
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45104571
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANNEALING; CRYSTAL GROWTH; DEPOSITION; ELECTRIC CONDUCTIVITY; ENERGY-LOSS SPECTROSCOPY; INTERFACES; MOLECULAR BEAM EPITAXY; OXIDATION; PERIODICITY; SOLIDS; SUBSTRATES; THIN FILMS; TITANIUM; TITANIUM OXIDES; TRANSMISSION ELECTRON MICROSCOPY; VANADIUM; VANADIUM OXIDES
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL REACTIONS; CRYSTAL GROWTH METHODS; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; EPITAXY; FILMS; HEAT TREATMENTS; METALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SPECTROSCOPY; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS; VANADIUM COMPOUNDS; VARIATIONS
Optional Information
- Notes
- (c) 2014 AIP Publishing LLC