Published 2009 | Version v1
Book

Sensitivity study to optimize the thickness of a moderator for use in the AP1000 source, intermediate, and power range ex-core detectors

  • 1. Westinghouse Electric Company, LLC, PO Box 158, Madison, PA 15663 (United States)

Description

The purpose of this paper is to discuss the coupled deterministic- stochastic analysis techniques and codes used to optimize the thickness of a polyethylene moderator for use in the AP1000 ex-core source, intermediate, and power range detectors. The analysis incorporated a 'bootstrapping' approach whereby an outward directed cylindrical boundary source was generated by DORT, source particle cumulative density functions (CDFs) in space, direction, and energy were formulated, these CDFs were processed by another code to create discrete source particles, and these discrete source particles were used by MCNP to calculate response functions which were meant to approximate detector signal responses. Furthermore, a simplistic stochastic study was performed to determine the maximum moderator thickness that should be considered for this application. For the AP1000, the optimum moderator thickness was the maximum allowed due to the mechanical design (1.38 cm) whereas for a general case the optimum moderator thickness is approximately 7.5 cm. (authors)

Additional details

Publishing Information

Publisher
American Nuclear Society - ANS
Imprint Place
La Grange Park (United States)
ISBN
978-0-89448-069-0
Imprint Pagination
11 p.

Conference

Title
2009 International Conference on Advances in Mathematics, Computational Methods, and Reactor Physics
Acronym
M and C 2009
Dates
3-7 May 2009
Place
Saratoga Springs, NY (United States)

INIS

Country of Publication
United States
Country of Input or Organization
France
INIS RN
42064773
Subject category
S97: MATHEMATICAL METHODS AND COMPUTING; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
APPROXIMATIONS; MODERATORS; OPTIMIZATION; POLYETHYLENES; POWER RANGE; RESPONSE FUNCTIONS; SENSITIVITY ANALYSIS; STOCHASTIC PROCESSES; THICKNESS
Descriptors DEC
CALCULATION METHODS; DIMENSIONS; FUNCTIONS; ORGANIC COMPOUNDS; ORGANIC POLYMERS; POLYMERS; POLYOLEFINS

Optional Information

Notes
4 refs.