Published August 2013 | Version v1
Journal article

Separation of C K-NEXAFS spectra for layer-by-layer analysis of carbon-based thin films: An n-alkane monolayer adsorbed on a monolayer graphene substrate grown on a Pt(1 1 1) surface

  • 1. Department of Organic and Polymer Materials Chemistry, Faculty of Engineering, Tokyo University of Agriculture and Technology, Koganei, Tokyo 184-8588 (Japan)
  • 2. Department of Applied Chemistry and Biotechnology, Faculty of Engineering, Chiba University, Inage-ku, Chiba 263-8522 (Japan)
  • 3. KEK-PF, Tsukuba, Ibaraki 305-0801 (Japan)

Description

Highlights: •Depth-dependent C K-NEXAFS spectral separation method is demonstrated. •The spectra of n-alkane monolayer are separated from those of monolayer graphene. •The results are equivalent with those obtained by the subtraction. -- Abstract: Spectral separation methods for X-ray absorption fine structure spectroscopy at the near carbon K-edge are examined for an n-C36H74 monolayer adsorbed on a monolayer graphene grown on a Pt(1 1 1) surface. The spectra of n-C36H74 and the monolayer graphene are separated by fitting decay curves obtained for all photon energies by detecting photoelectrons as a function of the ejection angle. The results are discussed in comparison with separation results obtained by subtracting the independently measured graphene spectra as a background

Availability note (English)

Available from http://dx.doi.org/10.1016/j.elspec.2013.05.003

Additional details

Identifiers

DOI
10.1016/j.elspec.2013.05.003;
PII
S0368-2048(13)00095-9;

Publishing Information

Journal Title
Journal of Electron Spectroscopy and Related Phenomena
Journal Volume
189
Journal Page Range
p. 27-31
ISSN
0368-2048
CODEN
JESRAW

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.