Published 2002 | Version v1
Report Open

Algorithm for preparation of multilayer systems with high critical angle of total reflection

Creators

  • 1. Texas A and M University, College Station, TX (United States)
  • 2. Frank Laboratory of Neutron Physics, Joint Institute for Nuclear Research, Dubna (Russian Federation)

Description

The new development of theory of multilayer systems is presented. It shows precisely how to calculate thickness and number of layers to get reflectivity close to unity for a given, in principle, arbitrary critical angle. Application of the new approach to real systems is demonstrated

Availability note (English)

Available from INIS in electronic form

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Additional details

Publishing Information

Imprint Pagination
20 p.
Report number
JINR-E--4-2002-264

INIS

Country of Publication
Joint Institute for Nuclear Research (JINR)
Country of Input or Organization
Joint Institute for Nuclear Research (JINR)
INIS RN
34075989
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ALGORITHMS; ASYMMETRY; BRAGG CURVE; COMPUTER CALCULATIONS; LAYERS; POLARIZATION; POTENTIALS; REFLECTION
Descriptors DEC
DIAGRAMS; INFORMATION; MATHEMATICAL LOGIC

Optional Information

Notes
15 refs., 13 figs., 1 tab.