Correction of systematic error due to continuous recording with X-ray spectrometer

The analytical study of the deformation of a line profile during a continuous exploration of the spectrum with automatic recording allows the determination of the corrections necessary for the reconstruction of the true profile. The mathematical introduction of the notion of distortion leads to the choice of experimental conditions. The application of the corrections thus determined gives to an automatic recording the same precision character as the point-by-point trace of a diffraction pattern. The considerations developed in this study extend quite naturally to other cases where the detection and recording system has a similar response to that of a delay cell. Reprint of a paper published in 'Journal de Physique et le Radium', t. 15, suppl. to no. 1, Jan 1954, p. 16A-22A.