Published May 2003
| Version v1
Journal article
A new approach to gas field ion sources
Creators
Description
A new approach to gas field ion sources is described. It is based on a structure made by inserting a field emission tip inside a small diameter tube. The tube supplies gas to the tip from a high-pressure chamber into a high-vacuum chamber where ionization takes place. Comparison of projection electron and ion micrographs shows that ionization results from a field ionization process taking place at the very end of the tip. Emission currents in the 10 nA range, for a few kV emission voltages, are obtained with various gases including neon, air and hydrogen. Lifetime experiments with H2 show stable emission for days
Additional details
Identifiers
- PII
- S0304399102003157;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 95
- Journal Issue
- 1
- Journal Page Range
- p. 183-188
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37039569
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- AIR; COMPARATIVE EVALUATIONS; CURRENTS; ELECTRIC POTENTIAL; ELECTRONS; FIELD EMISSION; HYDROGEN; ION SOURCES; IONIZATION; IONS; LIFETIME; NATURAL GAS FIELDS; NEON; PRESSURE RANGE MEGA PA 10-100; TUBES
- Descriptors DEC
- CHARGED PARTICLES; ELEMENTARY PARTICLES; ELEMENTS; EMISSION; EVALUATION; FERMIONS; FLUIDS; GASES; GEOLOGIC DEPOSITS; LEPTONS; MINERAL RESOURCES; NATURAL GAS DEPOSITS; NONMETALS; PRESSURE RANGE; PRESSURE RANGE MEGA PA; RARE GASES; RESOURCES
Optional Information
- Copyright
- Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.