Published May 2003 | Version v1
Journal article

A new approach to gas field ion sources

Description

A new approach to gas field ion sources is described. It is based on a structure made by inserting a field emission tip inside a small diameter tube. The tube supplies gas to the tip from a high-pressure chamber into a high-vacuum chamber where ionization takes place. Comparison of projection electron and ion micrographs shows that ionization results from a field ionization process taking place at the very end of the tip. Emission currents in the 10 nA range, for a few kV emission voltages, are obtained with various gases including neon, air and hydrogen. Lifetime experiments with H2 show stable emission for days

Additional details

Identifiers

PII
S0304399102003157;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
95
Journal Issue
1
Journal Page Range
p. 183-188
ISSN
0304-3991
CODEN
ULTRD6

Optional Information

Copyright
Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.