Published April 2001
| Version v1
Journal article
Multi-pixel p-i-n CdTe array fabricated by laser processing
- 1. Shizuoka Univ., Hamamatsu (Japan). Research Inst. of Electronics
Description
We developed a production method of p- and n-type semiconductor. The method consists of a doping method using excimer laser processing and an element isolation method using abrasion. CdTe pin array was produced by this method. The high concentration doping such as 9 x 1018 cm-3 of n type and 5 x 1018 cm-3 of p type were observed by In dopant and Sb dopant, respectively. The excimer laser is 248 nm wave length, 20 ns pulse width and 420 mJ the maximum energy. The laser cleaning improved current-voltage characteristics of pin diode. Array device production method by a laser processing combined laser pattern doping and abrasion is explained. (Y.S.)
Additional details
Publishing Information
- Journal Title
- Hoshasen
- Journal Volume
- 27
- Journal Issue
- 2
- Journal Page Range
- p. 23-28
- ISSN
- 0285-3604
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 33011953
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ABLATION; ANTIMONY; CDTE SEMICONDUCTOR DETECTORS; CRYSTAL DOPING; DIFFUSION; FABRICATION; IMPURITIES; INDIUM; LASER RADIATION; N-TYPE CONDUCTORS; P-TYPE CONDUCTORS; SEMICONDUCTOR JUNCTIONS; SURFACE CLEANING
- Descriptors DEC
- CLEANING; ELECTROMAGNETIC RADIATION; ELEMENTS; MATERIALS; MEASURING INSTRUMENTS; METALS; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR MATERIALS; SURFACE FINISHING