Published 2002 | Version v1
Miscellaneous

Rietveld analysis, powder diffraction and cement

Creators

  • 1. Australian Nuclear Science and Technology Organisation, NSW (Australia)

Description

Full text: Phase quantification of cement is essential in its industrial use, however many methods are inaccurate and/or time consuming. Powder diffraction is one of the more accurate techniques used for quantitative phase analysis of cement. There has been an increase in the use of Rietveld refinement and powder diffraction for the analysis and phase quantification of cement and its components in recent years. The complex nature of cement components, existence of solid solutions, polymorphic variation of phases and overlapping phase peaks in diffraction patterns makes phase quantification of cements by powder diffraction difficult. The main phase in cement is alite, a solid solution of tricalcium silicate. Tricalcium silicate has been found to exist in seven modifications in three crystal systems, including triclinic, monoclinic, and rhombohedral structures. Hence, phase quantification of cements using Rietveld methods usually involves the simultaneous modelling of several tricalcium silicate structures to fit the complex alite phase. An industry ordinary Portland cement, industry and standard clinker, and a synthetic tricalcium silicate were characterised using neutron, laboratory x-ray and synchrotron powder diffraction. Diffraction patterns were analysed using full-profile Rietveld refinement. This enabled comparison of x-ray, neutron and synchrotron data for phase quantification of the cement and examination of the tricalcium silicate. Excellent Rietveld fits were achieved, however the results showed that the quantitative phase analysis results differed for some phases in the same clinker sample between various data sources. This presentation will give a short introduction about cement components including polymorphism, followed by the presentation of some problems in phase quantification of cements and the role of Rietveld refinement in solving these problems. Copyright (2002) Australian X-ray Analytical Association Inc

Additional details

Publishing Information

Imprint Title
The National Conference and Exhibition of the Australian X-ray Analytical Association Inc
Imprint Pagination
210 p.
Journal Page Range
p. 79

Conference

Title
AXAA 2002. Analytical X-ray for Industry and Science
Dates
11-15 Feb 2002
Place
Newcastle, NSW (Australia)

INIS

Country of Publication
Australia
Country of Input or Organization
Australia
INIS RN
34032612
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
CEMENTS; DATA ANALYSIS; NEUTRON DIFFRACTION; PHASE STUDIES; SIMULATION; SYNCHROTRON RADIATION; X-RAY DIFFRACTION
Descriptors DEC
BREMSSTRAHLUNG; BUILDING MATERIALS; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; MATERIALS; RADIATIONS; SCATTERING

Optional Information

Notes
2 refs.