Published 1985 | Version v1
Book Metadata-only

Charge distribution of 85-200 MeV/amu Xe54+, Xe53+ and Xe52+ ions penetrating through solid targets

Creators

  • 1. Lawrence Berkeley Lab., CA (USA)
  • 2. Stanford Univ., CA (USA). Dept. of Physics
  • 3. Brookhaven National Lab., Upton, NY (USA)

Description

no abstract available

Part of:
Electronic and atomic collisions

Additional details

Publishing Information

Publisher
North-Holland.
Imprint Place
Amsterdam (Netherlands)
ISBN
0-444-86984-0
Imprint Title
Electronic and atomic collisions
Imprint Pagination
772 p.
Journal Page Range
p. 538.

Conference

Title
14. International conference on the physics of electronic and atomic collisions.
Dates
1985.
Place
Palo Alto, CA (USA).

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
17048266
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference, No Abstract
Descriptors DEI
CHARGE DISTRIBUTION; CROSS SECTIONS; ELECTRON CAPTURE; FOILS; INNER-SHELL IONIZATION; ION BEAMS; MULTICHARGED IONS; MYLAR; XENON IONS
Descriptors DEC
BEAMS; CAPTURE; CHARGED PARTICLES; ESTERS; IONIZATION; IONS; ORGANIC COMPOUNDS; ORGANIC POLYMERS; POLYESTERS; POLYMERS

Optional Information

Notes
Short communication; 5 refs. Imprint:Includes author index; many refs.; many figs.; many tabs.