New pulse-shape analysis method with multi-shaping amplifiers
- 1. Department of Nuclear Engineering, Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603 (Japan)
- 2. Toyota Soft Engineering Sakae 2-3-31, Naka-ku, Nagoya 460 (Japan)
Description
A novel pulse-shape analysis method that uses similarity to recognize an individual pulse shape is presented in this paper. We obtain four pulse heights by using four linear amplifiers with different shaping time constants. We treat a combination of the four pulse heights as a pattern vector. A similarity of the pulse shape can be obtained by comparison between the pattern vector and a discriminant vector which was given in advance. Each pulse shape is analyzed by using the similarity. The method has been applied for the improvement of characteristics of a CdZnTe semiconductor detector. The characteristics of the energy spectrum of the CdZnTe detector such as the photopeak efficiency or the peak-to-valley ratio are improved after the correction procedure with the similarity
Additional details
Identifiers
- PII
- S0168900298012595;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 421
- Journal Issue
- 1-2
- Journal Page Range
- p. 316-321
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34035393
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CDTE SEMICONDUCTOR DETECTORS; DATA ANALYSIS; GAMMA SPECTROSCOPY; PULSE ANALYZERS; PULSE SHAPERS; SIGNAL-TO-NOISE RATIO; ZINC TELLURIDES
- Descriptors DEC
- CHALCOGENIDES; ELECTRONIC CIRCUITS; ELECTRONIC EQUIPMENT; EQUIPMENT; MEASURING INSTRUMENTS; PULSE CIRCUITS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SIGNAL CONDITIONERS; SPECTROSCOPY; TELLURIDES; TELLURIUM COMPOUNDS; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 1999 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.