Published July 2019 | Version v1
Journal article

Temperature-dependent photoluminescence characterization of compressively strained AlGaInAs quantum wells

  • 1. University of Chinese Academy of Sciences, Beijing, 100049 (China)
  • 2. State Key Laboratory of Luminescence and Applications, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033 (China)

Description

A series of compressively strained AlGaInAs quantum well (QW) structures with different annealing treatment durations at 170 °C were investigated by temperature-dependent photoluminescence (PL). An abnormal S-shaped behavior in emission energy and a non-monotone evolution in spectral band width were observed at low temperature. A significant negative linear correlation between full width at half maximum (FWHM) and emission energy at different test temperature was exhibited in samples with different heat treatment durations. The highly linear relation demonstrated that the dependencies and relationships between PL peak energy and FWHM vs temperature are consistent. The anomalous blue shift and concomitant narrowing of FWHM in AlGaInAs QW were affected by lattice strain fluctuations due to the difference of thermal expansion coefficients between adjacent layers and strong carriers' localization at low temperature.

Additional details

Identifiers

DOI
10.1016/j.materresbull.2019.02.027;
PII
S0025540818326436;

Publishing Information

Journal Title
Materials Research Bulletin
Journal Volume
115
Journal Page Range
p. 196-200
ISSN
0025-5408
CODEN
MRBUAC

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
55035411
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
PHOTOLUMINESCENCE; QUANTUM WELLS; TEMPERATURE DEPENDENCE; THERMAL EXPANSION
Descriptors DEC
EMISSION; EXPANSION; LUMINESCENCE; NANOSTRUCTURES; PHOTON EMISSION

Optional Information

Copyright
Copyright (c) 2019 Elsevier Ltd. All rights reserved.