Published April 2005 | Version v1
Journal article

Application of micro-PIXE to quantitative analysis of heavy elements sorbed on minerals

  • 1. Department of Environmental Sciences, Japan Atomic Energy Research Institute, Tokai, Ibaraki 319-1195 (Japan)
  • 2. Advanced Science Research Center, JAERI, Tokai, Ibaraki 319-1195 (Japan)
  • 3. Advanced Radiation Technology Center, JAERI, Tokai, Ibaraki 319-1195 (Japan)

Description

Heavy element-sorbing montmorillonite and apatite were analyzed by micro-PIXE to examine its applicability to quantitative analysis of the heavy elements sorbed on these minerals. It was found that the sorbed heavy elements can be evaluated quantitatively using the linear correlation between the following two factors: (a) the concentration of the sorbed element in the mineral and (b) the ratio of the net peak area of characteristic X-ray from the sorbed element and to that from the matrix cation of the mineral. Mineralogical features of the tested minerals including heterogeneity of elemental distribution in the depth direction of the mineral hardly affected the results

Additional details

Identifiers

DOI
10.1016/j.nimb.2005.01.112;
PII
S0168-583X(05)00133-3;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
231
Journal Issue
1-4
Journal Page Range
p. 530-535
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
9. international conference on nuclear microprobe technology and applications
Acronym
ICNMTA-2004
Dates
13-17 Sep 2004
Place
Cavtat (Croatia)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37013869
Subject category
S58: GEOSCIENCES;
Resource subtype / Literary indicator
Conference
Descriptors DEI
APATITES; CATIONS; DEPTH; MICROANALYSIS; MONTMORILLONITE; PIXE ANALYSIS; SORPTION; X RADIATION
Descriptors DEC
CHARGED PARTICLES; CHEMICAL ANALYSIS; CLAYS; DIMENSIONS; ELECTROMAGNETIC RADIATION; INORGANIC ION EXCHANGERS; ION EXCHANGE MATERIALS; IONIZING RADIATIONS; IONS; MATERIALS; MINERALS; NONDESTRUCTIVE ANALYSIS; PHOSPHATE MINERALS; RADIATIONS; SILICATE MINERALS; X-RAY EMISSION ANALYSIS

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.