Published May 1991 | Version v1
Journal article

Factors affecting the formation, uniformity, and density of misfit and threading dislocation arrays during heteroepitaxial growth

  • 1. Department of Materials Science and Engineering, University of Illinois, Urbana, Illinois 61801 (USA)
  • 2. Department of Materials Science and Engineering, University of Liverpool, P.O. Box 147, Liverpool, L69 3BX (United Kingdom)

Description

An improved theory relating the separation of misfit dislocations in a heteroepitaxial thin film undergoing a continuous process of strain relaxation by the introduction of dislocations is presented. Because it provides a quantitative relationship between the dislocation spacing, misfit, total system energy, and film thickness, a number of quantities such as energy gain on formation of the dislocation network as a function of dislocation spacing can be estimated. The model allows calculation of useful thermodynamic quantities such as the compressibility of the misfit array which are useful for determining the average spacing of dislocations, the thickness at which dislocations are introduced (the critical thickness), and the dispersion in dislocation spacings in arrays

Additional details

Publishing Information

Journal Title
Journal of Vacuum Science and Technology, A
Journal Volume
9
Journal Issue
3
Series
J. Vac. Sci. Technol., A.
Journal Page Range
880-884
ISSN
0734-2101
CODEN
JVTAD

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
22074132
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
DISLOCATIONS; EPITAXY; FILMS; GROWTH; MATHEMATICAL MODELS; RELAXATION; STRAINS; THERMODYNAMICS
Descriptors DEC
CRYSTAL DEFECTS; CRYSTAL STRUCTURE; LINE DEFECTS