Published April 15, 1974 | Version v1
Journal article Metadata-only

Proton induced X-ray emission as a tool for trace element analysis

Creators

  • 1. Niels Bohr Institutet, Copenhagen (Denmark)

Description

no abstract available

Additional details

Identifiers

DOI
10.1016/0029-554x(74)90831-3;

Publishing Information

Journal Title
Nuclear Instruments and Methods
Journal Volume
116
Journal Issue
3
Series
Nucl. Instrum. Methods.
Journal Page Range
487-499
ISSN
0029-554X

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
5140771
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Descriptors DEI
ALPHA BEAMS; BACKGROUND RADIATION; BREMSSTRAHLUNG; HEAVY IONS; MEV RANGE 01-10; PROTON BEAMS; QUANTITATIVE CHEMICAL ANALYSIS; SEMICONDUCTOR DETECTORS; SENSITIVITY; TRACE AMOUNTS; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTROMETERS
Descriptors DEC
BEAMS; CHARGED PARTICLES; CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; ENERGY RANGE; HELIUM 4 BEAMS; ION BEAMS; IONS; MEASURING INSTRUMENTS; MEV RANGE; NUCLEON BEAMS; PARTICLE BEAMS; RADIATION DETECTORS; RADIATIONS; SPECTROMETERS

Optional Information

Notes
Updated automatically by Metadata and Full-Text Enrichment Agent