Published February 2018 | Version v1
Journal article

Selective enhancement of Selényi rings induced by the cross-correlation between the interfaces of a two-dimensional randomly rough dielectric film

  • 1. Department of Physics, NTNU – Norwegian University of Science and Technology, NO-7491 Trondheim (Norway)
  • 2. Surface du Verre et Interfaces, UMR 125 CNRS/Saint-Gobain, F-93303 Aubervilliers (France)

Description

By the use of both perturbative and non-perturbative solutions of the reduced Rayleigh equation, we present a detailed study of the scattering of light from two-dimensional weakly rough dielectric films. It is shown that for several rough film configurations, Selényi interference rings exist in the diffusely scattered light. For film systems supported by dielectric substrates where only one of the two interfaces of the film is weakly rough and the other planar, Selényi interference rings are observed at angular positions that can be determined from simple phase arguments. For such single-rough-interface films, we find and explain by a single scattering model that the contrast in the interference patterns is better when the top interface of the film (the interface facing the incident light) is rough than when the bottom interface is rough. When both film interfaces are rough, Selényi interference rings exist but a potential cross-correlation of the two rough interfaces of the film can be used to selectively enhance some of the interference rings while others are attenuated and might even disappear. This feature may in principle be used in determining the correlation properties of interfaces of films that otherwise would be difficult to access.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.aop.2017.12.003

Additional details

Identifiers

DOI
10.1016/j.aop.2017.12.003;
arXiv
arXiv:1709.02722v2;
PII
S0003491617303597;

Publishing Information

Journal Title
Annals of Physics (New York)
Journal Volume
389
Journal Page Range
p. 352-382
ISSN
0003-4916
CODEN
APNYA6

Optional Information

Notes
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