Published July 2018 | Version v1
Journal article

On spinodal decomposition in alnico - A transmission electron microscopy and atom probe tomography study

  • 1. Ames Lab, Ames, IA, 50011 (United States)
  • 2. Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831 (United States)

Description

Alnico is a prime example of a finely tuned nanostructure whose magnetic properties are intimately connected to magnetic annealing (MA) during spinodal transformation and subsequent lower temperature annealing (draw) cycles. Using a combination of transmission electron microscopy and atom probe tomography, we show how these critical processing steps affect the local composition and nanostructure evolution with impact on magnetic properties. The nearly 2-fold increase of intrinsic coercivity (Hci) during the draw cycle is not adequately explained by chemical refinement of the spinodal phases. Instead, increased Fe-Co phase (α1) isolation, development of Cu-rich spheres/rods/blades and additional α1 rod precipitation that occurs during the MA and draw, likely play a key role in Hci enhancement. Chemical ordering of the Al-Ni-phase (α2) and formation of Ni-rich (α3) may also contribute. Unraveling of the subtle effect of these nano-scaled features is crucial to understanding on how to improve shape anisotropy in alnico magnets.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.actamat.2018.04.042

Additional details

Identifiers

DOI
10.1016/j.actamat.2018.04.042;
arXiv
arXiv:1810.12580v1;
PII
S1359645418303197;

Publishing Information

Journal Title
Acta Materialia
Journal Volume
153
Journal Page Range
p. 15-22
ISSN
1359-6454
CODEN
ACMAFD

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
49095596
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ATOMS; COERCIVE FORCE; MAGNETIC PROPERTIES; MAGNETIZATION; MAGNETS; PROBES; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
DIAGNOSTIC TECHNIQUES; ELECTRON MICROSCOPY; EQUIPMENT; MICROSCOPY; PHYSICAL PROPERTIES

Optional Information

Copyright
Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.