Implementation and operation of a fiber-coupled CMOS detector in a low energy electron Microscope
Creators
- 1. Faculty of Physics and Center for Nanointegration Duisburg–Essen (CENIDE), University of Duisburg–Essen, Lotharstrasse. 1, 47057 Duisburg (Germany)
- 2. ELMITEC Elektronenmikroskopie GmbH, Albrecht-von-Groddeck-Str.3, 38678 Clausthal-Zellerfeld (Germany)
- 3. SPECS Surface Nano Analysis GmbH, Voltastrasse 5, 13355 Berlin (Germany)
Description
Highlights: • Implementation of a CMOS Detector at a low energy electron microscope. • Description of the installation and detector handling. • Examples for imaging and image contrast. The intrinsically weak signals in ultrafast electron microscopy experiments demand an improvement in the signal-to noise ratio of suitable electron detectors. We provide an experience report describing the installation and operation of a fiber-coupled CMOS based detector in a low energy electron microscope. We compare the detector performance to the traditional multi-channel-plate-based setup. The high dynamic range CMOS detector is capable of imaging spatially localized large intensity variations with low noise. The detector is blooming-free and overexposure appears uncritical. Overall, we find dramatic improvements in the imaging with the fiber-coupled CMOS detector compared to imaging with our previously used multi-channel-plate detector.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2020.113180Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2020.113180;
- PII
- S0304399120303223;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 221
- Journal Page Range
- vp.
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54112381
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ELECTRONS; EMISSION SPECTROSCOPY; FIBERS; NOISE; PERFORMANCE; PHOTOELECTRON SPECTROSCOPY; PLATES; SIGNALS; SIGNAL-TO-NOISE RATIO
- Descriptors DEC
- DIMENSIONLESS NUMBERS; ELECTRON SPECTROSCOPY; ELEMENTARY PARTICLES; FERMIONS; LEPTONS; MICROSCOPES; MICROSCOPY; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2020 Elsevier B.V. All rights reserved.