Published February 2021 | Version v1
Journal article

Implementation and operation of a fiber-coupled CMOS detector in a low energy electron Microscope

  • 1. Faculty of Physics and Center for Nanointegration Duisburg–Essen (CENIDE), University of Duisburg–Essen, Lotharstrasse. 1, 47057 Duisburg (Germany)
  • 2. ELMITEC Elektronenmikroskopie GmbH, Albrecht-von-Groddeck-Str.3, 38678 Clausthal-Zellerfeld (Germany)
  • 3. SPECS Surface Nano Analysis GmbH, Voltastrasse 5, 13355 Berlin (Germany)

Description

Highlights: • Implementation of a CMOS Detector at a low energy electron microscope. • Description of the installation and detector handling. • Examples for imaging and image contrast. The intrinsically weak signals in ultrafast electron microscopy experiments demand an improvement in the signal-to noise ratio of suitable electron detectors. We provide an experience report describing the installation and operation of a fiber-coupled CMOS based detector in a low energy electron microscope. We compare the detector performance to the traditional multi-channel-plate-based setup. The high dynamic range CMOS detector is capable of imaging spatially localized large intensity variations with low noise. The detector is blooming-free and overexposure appears uncritical. Overall, we find dramatic improvements in the imaging with the fiber-coupled CMOS detector compared to imaging with our previously used multi-channel-plate detector.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ultramic.2020.113180

Additional details

Identifiers

DOI
10.1016/j.ultramic.2020.113180;
PII
S0304399120303223;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
221
Journal Page Range
vp.
ISSN
0304-3991
CODEN
ULTRD6

Optional Information

Copyright
Copyright (c) 2020 Elsevier B.V. All rights reserved.