Published February 1, 1991
| Version v1
Journal article
E.S.D.'s and estimated probable error obtained in Rietveld refinements with local correlations
Creators
- 1. Ecole Centrale des Arts et Manufactures, 92 - Chatenay-Malabry (France). Lab. de Chimie-Physique du Solide
Description
Estimated standard deviations which are obtained in Rietveld refinements are known to decrease towards zero with the recording step, but serial correlations appear at the same time. A simple calculation which takes into account local correlations has been developed to furnish a reliable estimate of the values they would have if these correlations vanish. (orig.)
Additional details
Publishing Information
- Journal Title
- Journal of Applied Crystallography
- Journal Volume
- 24
- Journal Issue
- 1
- Series
- J. Appl. Crystallogr.
- Journal Page Range
- 1-5
- ISSN
- 0021-8898
- CODEN
- JACGA
INIS
- Country of Publication
- Denmark
- Country of Input or Organization
- Denmark
- INIS RN
- 22074105
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ALGORITHMS; CORRELATIONS; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; POWDERS; REFINING; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; SCATTERING