Real-time X-ray response of AlGaN/GaN-HEMT devices
Creators
- 1. Helmholtz Zentrum Muenchen, Ingolstaedter Landstr. 1, 85764 Neuherberg (Germany)
- 2. Walter Schottky Institut, Technische Universitaet Muenchen, Am Coulombwall 3, 85748 Garching (Germany)
Description
We present the real-time X-ray irradiation response of charge and pH sensitive solution gate AlGaN/GaN high electron mobility transistors (HEMTs). At the interface of the two materials a fixed space charge appears due to the difference in polarisation of the materials and a two-dimensional electron gas (2DEG) is produced. The electrical properties and therefore the conductivity of the system highly depend on the chip surface potential. We could demonstrate that the devices are stable and show reproducible behavior under and following X-ray radiation at different energies, including a linear integrated response with dose into the micro-gray range. Titration measurements of devices in solution reveal that the linear pH response and sensitivity are not only retained under X-ray irradiation, but an irradiation response could also be measured. The active areas of the sensors are in the size of about 1 mm2, which makes them an ideal candidate for dose determination in radiology applications. The devices are bio-compatible and can be simultaneously operated in aggressive fluids and under hard radiation. The development of this sensor device, which provides the possibility of online radiation dosimetry acquisition during biosensing applications, has a huge potential in radiation biophysics.
Additional details
Identifiers
Publishing Information
- Journal Title
- Verhandlungen der Deutschen Physikalischen Gesellschaft
- Journal Issue
- Regensburg 2010 issue
- Series
- Also available as printed version: Verhandlungen der Deutschen Physikalischen Gesellschaft v. 45(3)
- Journal Page Range
- [1 p.]
- ISSN
- 0420-0195
- CODEN
- VDPEAZ
Conference
- Title
- DPG Spring meeting 2010 of the condensed matter section with the divisions biological physics, chemical and polymer physics, crystallography, dielectric solids, dynamics and statistical physics, low temperature physics, magnetism, metal and material physics, physics of socio-economic systems, radiation and medical physics, semiconductor physics, surface science, thin films, vacuum science and technology as well as the working group industry and business, with job market, symposia, teachers' days, tutorials, exhibition of scientific instruments and literature
- Dates
- 21-26 Mar 2010
- Place
- Regensburg (Germany)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 42068223
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM NITRIDES; DOSE-RESPONSE RELATIONSHIPS; GALLIUM NITRIDES; REAL TIME SYSTEMS; SEMICONDUCTOR DETECTORS; TRANSISTORS; X-RAY DETECTION; X-RAY DOSIMETRY
- Descriptors DEC
- ALUMINIUM COMPOUNDS; DETECTION; DOSIMETRY; GALLIUM COMPOUNDS; MEASURING INSTRUMENTS; NITRIDES; NITROGEN COMPOUNDS; PNICTIDES; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DEVICES
Optional Information
- Notes
- Session: ST 2.2 Mo 13:50; No further information available