Published March 18, 2002 | Version v1
Journal article

Strong anisotropy of resonant inelastic x-ray scattering from charge-transfer excitations in UO3

  • 1. Department of Physics, Uppsala University, Uppsala (Sweden)
  • 2. Advanced Photon Source, Argonne National Laboratory, Argonne, IL (United States)
  • 3. Sharp Microelectronics Technology Inc., Camas, WA (United States)
  • 4. Department of Physics, Brooklyn College, Brooklyn, NY (United States)
  • 5. Chemical Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA (United States)

Description

Resonant x-ray scattering spectra of UO3 were measured at the U M5 edge using monochromatic photon excitation. Large differences in inelastic scattering profiles were observed between two 90 deg.-scattering geometries with the polarization vector of incident synchrotron radiation parallel and perpendicular to the scattering plane, respectively. For the latter case, a ∼9.5 eV energy-loss structure, associated with the O 2p → U 5f charge-transfer satellite, shows a significant intensity enhancement. The observed resonance behaviour allows an accurate estimation of the energy of this satellite, which is obscured in the other experimental geometry, and indicates the charge-transfer origin of the U M5 absorption structures at the respective excitation energies. (author)

Availability note (English)

Available online at the Web site for the Journal of Physics. Condensed Matter (ISSN 1361-6448X) http://www.iop.org/

Additional details

Publishing Information

Journal Title
Journal of Physics. Condensed Matter
Journal Volume
14
Journal Issue
10
Journal Page Range
p. 2541-2546
ISSN
0953-8984