Ultra-sensitive examination of environmental samples with SRL Underground Counting Facility
Description
The ability to detect contaminants at very low-levels in environmental samples promises early identification and correction of harmful industrial practices. To achieve this capability, the Savannah River Laboratory Underground Counting Facility (SRLUCF) was developed. This paper appraises resulting improvements in detection sensitivity, and discusses recent applications. SRLUCF utilizes hardware and software customized for low-level counting. An uninterruptible power supply limits data losses. An MCA-coupled-IBM/PC-XT system collects HPGe, dual-coincidence NaI(Tl), and NaI(Tl) background spectra, which are analyzed by computer codes GRABGAM, GRABDUAL, and GRABNAI. These codes incorporate numerous efficiencies, integral peak-fitting, and comprehensive I/O-features. Spectral files may be transferred to any IBM-PC for further analysis. The facility improves detection sensitivity via extended counting times, background reduction, and improved detector efficiency. A constant background extends counting time from one to ten days
Availability note (English)
MF available from INIS under the Report Number; Available from NTIS, PC A02/MF A01; 1 as DE87006384.
Files
Additional details
Publishing Information
- Imprint Pagination
- 6 p.
- Report number
- DP-MS--86-203
Conference
- Title
- Annual meeting of the American Nuclear Society.
- Dates
- 7-12 Jun 1987.
- Place
- Dallas, TX (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 18086293
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S54: ENVIRONMENTAL SCIENCES;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ENVIRONMENTAL MATERIALS; HIGH-PURITY GE DETECTORS; LOW LEVEL COUNTING; NAI DETECTORS; SAVANNAH RIVER PLANT; UNDERGROUND FACILITIES
- Descriptors DEC
- COUNTING TECHNIQUES; GE SEMICONDUCTOR DETECTORS; MATERIALS; MEASURING INSTRUMENTS; NATIONAL ORGANIZATIONS; RADIATION DETECTORS; SCINTILLATION COUNTERS; SEMICONDUCTOR DETECTORS; SOLID SCINTILLATION DETECTORS; US AEC; US DOE; US ERDA; US ORGANIZATIONS
Optional Information
- Notes
- Portions of this document are illegible in microfiche products.
- Secondary number(s)
- CONF-870601--13.