Cross-sectional observation of damage structures in Al2O3 irradiated with multiple beams of H,He, and O ions and after annealing at 1273 K
- 1. Japan Atomic Energy Res. Inst., Ibaraki (Japan). Dept. of Mater. Sci. and Eng.
- 2. Department of Materials Development, Japan Atomic Energy Research Institute, Takasaki, Gunma 370-12 (Japan)
Description
Damage structures in a single crystal α-Al2O3 sample irradiated with triple (0.25 MeV H+, 0.6 MeV He+ and 2.4 MeV O2+) ion beams at 923 K to a peak dose of 3.6 dpa were characterized by dislocation loops distributed from the region close to the incident surface to the region of 1.8 μm in depth, with cavities being formed in the restricted region of depths from 1.2 to 1.75 μm. A similar depth profile of damage structures was formed in a sample inradiated with dual (0.25 MeV H+ and 2.4 MeV O+) ion beams to a peak dose of 10.6 dpa, except that tiny cavities were formed down to the smaller depth of 0.5 μm. Depth profiles of implanted hydrogen atoms measured through a nuclear reaction analysis revaled that point defect mobilities were largely enhanced in the presence of hydrogen without helium. Upon annealing for 1 h at 1273 K, cavities grown to 70-80 nm at the maximum size were formed around peak damage regions in both the irradiated samples. Resultant cavity swellings were 6.2% and 18%, the ratio of which was found to be equal to that of accumulated damage. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 140
- Journal Issue
- 1-2
- Journal Page Range
- p. 152-158
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 29042294
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM OXIDES; ANNEALING; CAVITIES; CRYSTAL DEFECTS; HELIUM IONS; HYDROGEN IONS; ION BEAMS; ION IMPLANTATION; OXYGEN IONS; POINT DEFECTS; RADIATION EFFECTS; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- ALUMINIUM COMPOUNDS; BEAMS; CHALCOGENIDES; CHARGED PARTICLES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; HEAT TREATMENTS; IONS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS
Optional Information
- Notes
- 10 refs.