Published October 2008 | Version v1
Journal article

Spatial resolution study and power calibration of the high-k scattering system on NSTX

  • 1. Department of Physics, POSTECH, Pohang 790-784 (Korea, Republic of)
  • 2. Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543 (United States)
  • 3. Department of Applied Science, University of California at Davis, Davis, California 95616 (United States)

Description

NSTX high-k scattering system has been extensively utilized in studying the microturbulence and coherent waves. An absolute calibration of the scattering system was performed employing a new millimeter-wave source and calibrated attenuators. One of the key parameters essential for the calibration of the multichannel scattering system is the interaction length. This interaction length is significantly different from the conventional one due to the curvature and magnetic shear effect.

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
79
Journal Issue
10
Journal Page Range
p. 10E723-10E723.3
ISSN
0034-6748
CODEN
RSINAK

Optional Information

Notes
(c) 2008 American Institute of Physics